JEDEC STANDARDS PDF

JEDEC is the global leader in developing open standards for the microelectronics industry. With over 4,000 volunteers representing nearly 300 member companies. JEDEC brings manufacturers and suppliers together on 50 different committees, creating standards to meet the diverse technical and developmental needs of the industry. These collaborations ensure product interoperability, benefiting the industry and ultimately consumers by decreasing time-to-market and reducing product development costs.

JEDEC JESD 24-5 (R2002)

This method describes a means for testing the ability of a power switching device to withstand avala..

$24.00 $48.00

JEDEC JESD 24-6 (R2002)

This standard describes in detail the method for thermal measurements of Insulated Gate Bipolar Tran..

$24.00 $47.00

JEDEC JESD 24-7 (R2002)

Defines methods for verifying the diode recovery stress capability of power transistors. Details Pu..

$26.00 $51.00

JEDEC JESD 24-8 (R2002)

Determines the repetitive inductive avalanche switching capability of power switching transistors. D..

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JEDEC JESD 24-9 (R2002)

Test method to determine how long a device can survive a short circuit condition with a given drive ..

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JEDEC JESD 27

This JEDEC standard was approved for rescission by acclamation of theJEDEC Board of Directors on May..

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JEDEC JESD 31C

This publication identifies the general requirements for Distributors that supply Commercial and Mil..

$34.00 $67.00

JEDEC JESD 320-A (R2002)

This standard provides guidance for achieving equilibrium when measuring temperature sensitive stati..

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JEDEC JESD 321-C (R2009)

This standard gives the system for numbering like-named electrodes or terminal functions in semicond..

$27.00 $53.00

JEDEC JESD 35-1

This addendum expands the usefulness of the Standard 35 (JESD35) by detailing the various sources of..

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JEDEC JESD 35-2

This addendum includes test criteria to supplement JESD35. JESD35 describes procedures developed for..

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JEDEC JESD 35-A

The revised JESD35 is intended for use in the MOS Integrated Circuit manufacturing industry. It desc..

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JEDEC JESD 353 (R2009)

This noise measurement method applies to transistors whose noise has a Gaussian power distribution, ..

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JEDEC JESD 354 (R2009)

This standard provides a method for determining values, for device registration purposes, for transi..

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JEDEC JESD 36

This standard outlines the standard dc specifications, test conditions, and test loading for logic p..

$28.00 $56.00

JEDEC JESD 37

This standard details techniques for estimating the values of a two parameter lognormal distribution..

$38.00 $76.00

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