JEDEC STANDARDS PDF JEDEC is the global leader in developing open standards for the microelectronics industry. With over 4,000 volunteers representing nearly 300 member companies. JEDEC brings manufacturers and suppliers together on 50 different committees, creating standards to meet the diverse technical and developmental needs of the industry. These collaborations ensure product interoperability, benefiting the industry and ultimately consumers by decreasing time-to-market and reducing product development costs.
The purpose of this standard is definition of an energy backed byte addressable function on a nonvol..
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This standard establishes the requirements for timely notification to affected customers after a dis..
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This standard defines the DC and AC operating conditions, I/O impedances, termination characteristic..
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This standard defines the electrical and mechanical requirements for 288-pin, 1.2 Volt (VDD), Double..
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This standard defines the electrical and mechanical requirements for 288-pin, 1.2 Volt (VDD), Double..
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This standard provides a test method and definition for small-signal conditions at microwave frequen..
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This document defines the Graphics Double Data Rate 6 (GDDR6) Synchronous Graphics Random Access Mem..
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JEDEC JESD250A defines the Graphics Double Data Rate 6 (GDDR6) Synchronous Graphics Random Access Me..
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This document defines the Graphics Double Data Rate 6 (GDDR6) Synchronous Graphics Random Access Mem..
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JEDEC JESD251 is intended for use by SoC, ASIC, ASSP, and FPGA developers or vendors interested in i..
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This purpose of JEDEC JESD251-1 is to add an optional 4-bit bus width (x4) to JESD251, xSPI standard..
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JEDEC JESD252 is intended for use by SoC, ASIC, ASSP, and FPGA developers or vendors interested in i..
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This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induc..
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This document describes an accelerated test for measuring the hot-carrier-induced degradation of a s..
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This standard provided definitions, electrical characteristics circuit technology, letter symbols an..
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The test methods described in this Standard are generally applicable to alloy-like devices for which..
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