JEDEC STANDARDS PDF JEDEC is the global leader in developing open standards for the microelectronics industry. With over 4,000 volunteers representing nearly 300 member companies. JEDEC brings manufacturers and suppliers together on 50 different committees, creating standards to meet the diverse technical and developmental needs of the industry. These collaborations ensure product interoperability, benefiting the industry and ultimately consumers by decreasing time-to-market and reducing product development costs.
This document provides a comprehensive definition of the e*MMC Electrical Interface, its environment..
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This document provides a comprehensive definition of the e*MMC Electrical Interface, its environment..
$142.00 $284.00
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This document provides a comprehensive definition of the e•MMC Electrical Interface, its enviro..
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This document provides a comprehensive definition of the e•MMC Electrical Interface, its enviro..
$153.00 $305.00
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This document provides a comprehensive definition of the e*MMC Electrical Interface, its environment..
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This document is a mechanical product specification for a high capacity embedded memory device using..
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This standard establishes methods for calculating failure rates in units of FITs by using data in va..
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This standard is intended to describe various methods for obtaining electrical variate data on devic..
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This document describes design of test structures needed to assess the reliability of aluminum-coppe..
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This reference for technical writers and educators, manufacturers, and buyers and users of discrete ..
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This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and b..
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This test method is offered as standardized procedure to determine the alpha particle Soft Error Rat..
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This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid..
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This specification defines the standard requirements and procedures for terrestrial soft-error-rate ..
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This standard (a replacement of JEDEC Standards No. 8, 8-1, 8-1-A, and 8-A) defines dc interface par..
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This document describes an accelerated stress and test methodology for measuring device parameter ch..
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