JEDEC STANDARDS PDF JEDEC is the global leader in developing open standards for the microelectronics industry. With over 4,000 volunteers representing nearly 300 member companies. JEDEC brings manufacturers and suppliers together on 50 different committees, creating standards to meet the diverse technical and developmental needs of the industry. These collaborations ensure product interoperability, benefiting the industry and ultimately consumers by decreasing time-to-market and reducing product development costs.
The predominant terminal finishes on electronic components have been Sn-Pb alloys. As the industry m..
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This test method provides various tests for determining the integrity lead/package interface and the..
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This test method provides two tests for determining the marking permanency of ink marked integrated ..
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The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from c..
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The new test method JESD22-B110 provides guidance for in-situ testing of mechanical shock resistance..
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This standard describes a nondestructive test to assess solid state device mark legibility. The spec..
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This document describes a test method only; acceptance criteria and qualification requirements are n..
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This standard specifies a collection of procedures for testing and character designation of liquid c..
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This standard details the methods to be followed if color coding is used to identify JEDEC-assigned ..
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This standard contains a listing of terms and definitions and letter symbols; a description of estab..
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Describes the method of a typical oscilloscope waveform and the basic test circuit employed in the m..
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Test method to measure the reverse recovery characteristics of the drain source diode of a power MOS..
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Test method to measure the equivalent resistance of the gate to source of a power MOSFET.
Details P..
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This addendum establishes a method for measuring power device gate charge. A gate charge test is per..
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The purpose of this test method is to measure the thermal impedance of the MOSFET under the specifie..
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The purpose of this test method is to measure the thermal impedance of the Bipolar Transistor under ..
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