ASTM F1892-12(2018)
- Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
- standard by ASTM International, 03/01/2018
- Category: ASTM
$76.00
$38.00
1.1 This guide presents background and guidelines for establishing an appropriate sequence of tests and data analysis procedures for determining the ionizing radiation (total dose) hardness of microelectronic devices for dose rates below 300 rd(SiO2)/s. These tests and analysis will be appropriate to assist in the determination of the ability of the devices under test to meet specific hardness requirements or to evaluate the parts for use in a range of radiation environments.
PDF
All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.
Multi-User Access
After purchasing, you have the ability to assign each license to a specific user.
Printable
At any time, you are permitted to make printed copies for your and your members' reference use.
ASTM F2875-10(2015)
Standard Guide for Laboratory Requirements Necessary to Test Commercial Cooking and Warming Applianc..
$24.00 $48.00
ASTM F2945-15
Standard Specification for Polyamide 11 Gas Pressure Pipe, Tubing, and Fittings..
$33.00 $65.00
ASTM F754-08(2015)
Standard Specification for Implantable Polytetrafluoroethylene (PTFE) Sheet, Tube, and Rod Shapes Fa..
$21.00 $42.00
ASTM A970/A970M-15
Standard Specification for Headed Steel Bars for Concrete Reinforcement..
$29.00 $58.00