• CIE x036:2010

CIE x036:2010

  • Proceedings of CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry (30-31 August 2010, Bern, Swit
  • Conference Proceeding by Commission Internationale de L'Ecl
  • Category: CIE

$203.52 $102.00

This Symposium was organised by CIE Division 2 in cooperation with the SwissLighting Society (SLG), and was hosted by the Federal Office of Metrology (METAS),Bern, Switzerland. The two-day Symposium included a one day tutorial presentingthe state-of-the-art techniques in the field of photometry. On the second day, aScientific Symposium featured 35 contributed papers presenting recent research inphotometry, colorimetry, and radiometry with a focus on the methods using spectraland imaging techniques. The Symposium had four sessions, Session I:Goniophotometry and Spatial Methods, Session II: Imaging and Spectral Methods,Session III: Metrology for LEDs, and Session IV: Advances in Radiometry.
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