IEEE 1445-1998
- IEEE Standard for Digital Test Interchange Format (DTIF)
- standard by IEEE, 03/10/1999
- Category: IEEE
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New IEEE Standard - Superseded.The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deA?ned. This information can be broadly grouped into data that deA?nes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.
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