• IEEE 1450.6.1-2009

IEEE 1450.6.1-2009

  • IEEE Standard for Describing On-Chip Scan Compression
  • standard by IEEE, 07/13/2009
  • Category: IEEE

$126.00 $63.00

New IEEE Standard - Active.This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.
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SAE J864_201801

SAE J864_201801

Surface Hardness Testing with Files (Stabilized: Jan 2018)..

$41.00 $81.00

SAE AMSWWT700/4B

SAE AMSWWT700/4B

Tube, Aluminum Alloy, Drawn, Seamless, 5052 (Stabilized: Jan 2018)..

$41.00 $81.00

SAE AMS4306C

SAE AMS4306C

Aluminum Alloy, Plate 6.4Zn - 2.4Mg - 2.2Cu - 0.12Zr (7150-T6151) Solution Heat Treated, Stress Reli..

$41.00 $81.00

SAE AMS4330C

SAE AMS4330C

Aluminum Alloy, Plate (2297-T87) 2.8Cu - 1.5Li - 0.30Mn - 0.12Zr Solution Heat Treated, Stretched, a..

$41.00 $81.00