• IEEE 1620-2004

IEEE 1620-2004

  • Standard for Test Methods for the Characterization of Organic Transistors and Materials
  • standard by IEEE, 04/29/2004
  • Category: IEEE

$132.00 $66.00

New IEEE Standard - Superseded.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
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