• IEEE 662-1980

IEEE 662-1980

  • IEEE Standard Terminology for Semiconductor Memory
  • standard by IEEE, 11/26/1980
  • Category: IEEE

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New IEEE Standard - Superseded.
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JIS D 4418:1996

JIS D 4418:1996

Test procedure of porosity for brake linings and pads of automobiles (FOREIGN STANDARD)..

$20.00 $39.00

JIS C 4530:1996

JIS C 4530:1996

Hinge type electromagnetic relays..

$27.00 $54.00

JIS A 1118:1997

JIS A 1118:1997

Method of test for air content of fresh concrete by volumetric method..

$9.00 $18.00

JIS B 8355:1997

JIS B 8355:1997

Hydraulic fluid power -- Subplate type solenoid operated four-port valves..

$27.00 $54.00