• JEDEC EIA 318-B

JEDEC EIA 318-B

  • MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
  • standard by JEDEC Solid State Technology Association, 07/01/1996
  • Category: JEDEC

$59.00 $30.00

This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JEP149

JEDEC JEP149

APPLICATION THERMAL DERATING METHODOLOGIES..

$30.00 $59.00

JEDEC JESD82-6A

JEDEC JESD82-6A

DEFINITION OF THE SSTV32852 2.5 V 24-BIT TO 48-BIT SSTL_2 REGISTERED BUFFER FOR 1U STACKED DDR DIMM ..

$30.00 $59.00

JEDEC JESD82-3B

JEDEC JESD82-3B

DEFINITION OF THE SSTV16857 2.5 V, 14-BIT SSTL_2 REGISTERED BUFFER FOR DDR DIMM APPLICATIONS..

$30.00 $59.00

JEDEC JESD22-A103C

JEDEC JESD22-A103C

HIGH TEMPERATURE STORAGE LIFE..

$26.00 $51.00