• JEDEC JEP 143B.01

JEDEC JEP 143B.01

  • SOLID STATE RELIABILITY ASSESSMENT QUALIFICATION METHODOLOGIES
  • standard by JEDEC Solid State Technology Association, 06/01/2008
  • Category: JEDEC

$76.00 $38.00

The purpose of this publication is to provide an overview of some of the most commonly used systems and test methods historically performed by manufacturers to assess and qualify the reliability of solid state products. The appropriate references to existing and proposed JEDEC (or EIA) standards and publications are cited. This document is also intended to provide an educational background and overview of some of the technical and economic factors associated with assessing and qualifying microcircuit reliability.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD22-A108E

JEDEC JESD22-A108E

TEMPERATURE, BIAS, AND OPERATING LIFE..

$27.00 $54.00

JEDEC JESD209-4-1

JEDEC JESD209-4-1

Addendum No. 1 to JESD209-4 - Low Power Double Data Rate 4 (LPDDR4)..

$40.00 $80.00

JEDEC JESD209-4B

JEDEC JESD209-4B

Low Power Double Data Rate 4 (LPDDR4)..

$153.00 $305.00

JEDEC JESD79-4-1

JEDEC JESD79-4-1

Addendum No. 1 to JESD79-4, 3D Stacked DRAM Standard..

$53.00 $106.00