JEDEC JEP110
- GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS
- standard by JEDEC Solid State Technology Association, 07/01/1988
- Category: JEDEC
$54.00
$27.00
This publication is intended for power GaAs FET applications requiring high reliability. An accurate measurement of thermal resistance is extremely important to provide the user with knowledge of the FETs operating temperature so that more accurate life estimates can be made. FET failure mechanisms and failure rates have, in general, an exponential dependence on temperature (which is why temperature-accelerated testing is successful). Because of the exponential relationship of failure rate with temperature, the thermal resistance should be referenced to the hottest part of the FET.

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

After purchasing, you have the ability to assign each license to a specific user.

At any time, you are permitted to make printed copies for your and your members' reference use.