• JEDEC JEP132 (R2007)

JEDEC JEP132 (R2007)

  • PROCESS CHARACTERIZATION GUIDELINE
  • standard by JEDEC Solid State Technology Association, 07/01/1998
  • Category: JEDEC

$76.00 $38.00

This guideline provides a methodology to characterize a new or existing process and is applicable to any manufacturing or service process. It describes when to use specific tools such as failure mode effects analysis (FEMA), design or experiments (DOE), measurement system evaluation (MSE), capability analysis (CpK), statistical process control (SPC), and problem solving tools. It also provides a brief description of each tool. In December 2004 the document was renumbered to conform with JM7, JEDEC Style Manual.
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JEDEC JESD 209-2B

JEDEC JESD 209-2B

LOW POWER DOUBLE DATA RATE 2 (LPDDR2)..

$124.00 $247.00

JEDEC JESD 209B

JEDEC JESD 209B

LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD..

$58.00 $116.00

JEDEC JESD 35-A

JEDEC JESD 35-A

PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS..

$44.00 $87.00

JEDEC JESD84-A441

JEDEC JESD84-A441

EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write,..

$124.00 $247.00