• JEDEC JEP153

JEDEC JEP153

  • CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES
  • standard by JEDEC Solid State Technology Association, 01/01/2008
  • Category: JEDEC

$60.00 $30.00

This document provides an industry standard method for characterization and monitoring thermal stress test oven temperatures. The procedures described in this document should be used to insure thermal stress test conditions are being achieved and maintained during various test procedures.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD22-A119A

JEDEC JESD22-A119A

LOW TEMPERATURE STORAGE LIFE..

$26.00 $51.00

JEDEC JESD232

JEDEC JESD232

Graphics Double Data Rate (GDDR5X) SGRAM Standard..

$104.00 $208.00

JEDEC JESD235A

JEDEC JESD235A

HIgh Bandwidth Memory (HBM) DRAM..

$104.00 $208.00

JEDEC JESD209-4A

JEDEC JESD209-4A

Low Power Double Data Rate 4 (LPDDR4)..

$142.00 $284.00