• JEDEC JESD 22-A110C

JEDEC JESD 22-A110C

  • HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
  • standard by JEDEC Solid State Technology Association, 01/01/2009
  • Category: JEDEC

$54.00 $27.00

The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs severe conditions of temperature, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD 82-24

JEDEC JESD 82-24

DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS..

$36.00 $72.00

JEDEC JESD 82-25

JEDEC JESD 82-25

DEFINITION OF the SSTUB32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICA..

$40.00 $80.00

JEDEC JESD 82-26

JEDEC JESD 82-26

DEFINITION OF THE SSTUB32868 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS..

$37.00 $74.00

JEDEC JESD 82-27

JEDEC JESD 82-27

DEFINITION OF THE SSTUB32869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS..

$38.00 $76.00