JEDEC JESD 22-B108A
- COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
- standard by JEDEC Solid State Technology Association, 01/01/2003
- Category: JEDEC
$53.00
$27.00
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.
![](https://www.stdlink.com/image/catalog/pdf.png)
All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.
![](https://www.stdlink.com/image/catalog/Multi-User-Access.png)
After purchasing, you have the ability to assign each license to a specific user.
![](https://www.stdlink.com/image/catalog/Printable.png)
At any time, you are permitted to make printed copies for your and your members' reference use.