• Your shopping cart is empty!

  • JEDEC JESD 22-B108A

JEDEC JESD 22-B108A

  • COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
  • standard by JEDEC Solid State Technology Association, 01/01/2003
  • Category: JEDEC

$53.00 $27.00

The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.

Details

Published:
01/01/2003
Number of Pages:
11
File Size:
1 file , 69 KB
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD51-10

JEDEC JESD51-10

TEST BOARDS FOR THROUGH-HOLE PERIMETER LEADED PACKAGE THERMAL MEASUREMENTS..

$28.00 $56.00

JEDEC JESD64-A

JEDEC JESD64-A

STANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES WITH 3.6 V CMOS TOLERANT INPUTS AND OUTPUTS..

$26.00 $51.00

JEDEC JESD 22-A118 (R2008)

JEDEC JESD 22-A118 (R2008)

ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST..

$27.00 $53.00

JEDEC JEP139

JEDEC JEP139

GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR ST..

$30.00 $59.00