• JEDEC JESD 22-B110A (R2009)

JEDEC JESD 22-B110A (R2009)

  • SUBASSEMBLY MECHANICAL SHOCK
  • standard by JEDEC Solid State Technology Association, 11/01/2004
  • Category: JEDEC

$56.00 $28.00

The new test method JESD22-B110 provides guidance for in-situ testing of mechanical shock resistance of components as mounted in a subassembly. Using terms, procedures, and test levels in common with JESD22-B104B, this test method provides a range of test level options to improve test applicability and compatibility with fragility test procedures. Test procedures are detailed, including test card and fixture needs, test tolerances, test documentation, component preparation, and definition of terms.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD51-1

JEDEC JESD51-1

INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)..

$39.00 $78.00

JEDEC JESD38

JEDEC JESD38

STANDARD FOR FAILURE ANALYSIS REPORT FORMAT..

$27.00 $54.00

JEDEC JESD54

JEDEC JESD54

STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICES..

$39.00 $78.00

JEDEC JESD 35-2

JEDEC JESD 35-2

ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS..

$27.00 $54.00