• JEDEC JESD 22-B114

JEDEC JESD 22-B114

  • MARK LEGIBILITY
  • standard by JEDEC Solid State Technology Association, 03/01/2008
  • Category: JEDEC

$54.00 $27.00

This standard describes a nondestructive test to assess solid state device mark legibility. The specification applies only to solid state devices that contain markings, regardless of the marking method. It does not define what devices must be marked or the method in which the device is marked, i.e., ink, laser, etc. The standard is limited in scope to the legibility requirements of solid state devices, and does not replace related reference documents listed in this standard.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD 209B

JEDEC JESD 209B

LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD..

$58.00 $116.00

JEDEC JESD 35-A

JEDEC JESD 35-A

PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS..

$44.00 $87.00

JEDEC JESD84-A441

JEDEC JESD84-A441

EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write,..

$124.00 $247.00

JEDEC JESD213

JEDEC JESD213

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ..

$27.00 $53.00