• JEDEC JESD 24-3

JEDEC JESD 24-3

  • ADDENDUM No. 3 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR VERTICAL POWER MOSFETS (DELTA SOURCE-DRAIN VOLTAGE METHOD)
  • Amendment by JEDEC Solid State Technology Association, 11/01/199
  • Category: JEDEC

$59.00 $30.00

The purpose of this test method is to measure the thermal impedance of the MOSFET under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity if the forward voltage drop of the source-drain is used as the junction temperature indicator. This method is particularly suitable to enhancement mode, power MOSFETs having relatively long thermal response times. This test method may be used to measure the thermal response of junction to a heating pulse, to ensure proper die mountdown to its case, or the dc thermal resistance, by the proper choice of the pulse duration and magnitude if the heating pulse.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD79-3-1A

JEDEC JESD79-3-1A

Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600..

$34.00 $67.00

JEDEC JESD226

JEDEC JESD226

RF Biased Life (RFBL) Test Method..

$30.00 $60.00

JEDEC JESD224

JEDEC JESD224

Universal Flash Storage (UFS) Test..

$153.00 $305.00

JEDEC JESD30F

JEDEC JESD30F

Descriptive Designation System for Semiconductor-device Packages..

$37.00 $74.00