• JEDEC JESD22-A108D

JEDEC JESD22-A108D

  • TEMPERATURE, BIAS, AND OPERATING LIFE
  • standard by JEDEC Solid State Technology Association, 11/01/2010
  • Category: JEDEC

$54.00 $27.00

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices' operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this document.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD30E

JEDEC JESD30E

DESCRIPTIVE DESIGNATION SYSTEM FOR SEMICONDUCTOR-DEVICE PACKAGES..

$36.00 $72.00

JEDEC JESD201A

JEDEC JESD201A

ENVIRONMENTAL ACCEPTANCE REQUIREMENTS FOR TIN WHISKER SUSCEPTIBILITY OF TIN AND TIN ALLOY SURFACE FI..

$37.00 $74.00

JEDEC JESD15-4

JEDEC JESD15-4

DELPHI COMPACT THERMAL MODEL GUIDELINE..

$34.00 $67.00

JEDEC JESD15

JEDEC JESD15

THERMAL MODELING OVERVIEW..

$26.00 $51.00