• JEDEC JESD22-A110E

JEDEC JESD22-A110E

  • HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
  • standard by JEDEC Solid State Technology Association, 07/01/2015
  • Category: JEDEC

$54.00 $27.00

The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs severe conditions of temperature, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD47I

JEDEC JESD47I

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS..

$36.00 $72.00

JEDEC JESD9B

JEDEC JESD9B

Inspection Criteria for Microelectronic Packages and Covers..

$71.00 $141.00

JEDEC JESD22-B114A

JEDEC JESD22-B114A

Mark Legibility..

$28.00 $56.00

JEDEC JESD221

JEDEC JESD221

Alpha Radiation Measurement in Electronic Materials..

$37.00 $74.00