• JEDEC JESD22-B105E

JEDEC JESD22-B105E

  • Lead Integrity
  • standard by JEDEC Solid State Technology Association, 02/01/2018
  • Category: JEDEC

$62.00 $31.00

This test method provides various tests for determining the integrity lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for reassembly. For hermetic packages it is recommend that this test be followed by hermeticity tests in accordance with Test Method A109 to determine if there are any adverse effects from the stresses applied to the seals as well as to the leads. These tests, including each of its test conditions, is considered destructive and is only recommended for qualification testing. This test is applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD307 (R2002)

JEDEC JESD307 (R2002)

VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENT..

$24.00 $48.00

JEDEC EIA 323 (R2002)

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES..

$26.00 $51.00

JEDEC JESD6 (R2002)

JEDEC JESD6 (R2002)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE..

$30.00 $59.00

JEDEC JESD340 (R2009)

JEDEC JESD340 (R2009)

STANDARD FOR THE MEASUREMENT OF CRE..

$27.00 $54.00