• JEDEC JESD22-B113

JEDEC JESD22-B113

  • BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
  • standard by JEDEC Solid State Technology Association, 03/01/2006
  • Category: JEDEC

$62.00 $31.00

The Board Level Cyclic Bend Test Method is intended to evaluate and compare the performance of surface mount electronic components in an accelerated test environment for handheld electronic products applications. The purpose is to standardize the test methodology to provide a reproducible performance assessment of surface mounted components while duplicating the failure modes normally observed during product level test. This is not a component qualification test and is not meant to replace any product level test that may be needed to qualify a specific product and assembly.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD209-4A

JEDEC JESD209-4A

Low Power Double Data Rate 4 (LPDDR4)..

$142.00 $284.00

JEDEC JEP151

JEDEC JEP151

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power ..

$31.00 $62.00

JEDEC JESD245

JEDEC JESD245

Byte Addressable Energy Backed Interface..

$82.00 $163.00

JEDEC JESD241

JEDEC JESD241

Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities..

$37.00 $74.00