• JEDEC JESD221

JEDEC JESD221

  • Alpha Radiation Measurement in Electronic Materials
  • standard by JEDEC Solid State Technology Association, 05/01/2011
  • Category: JEDEC

$74.00 $37.00

The purpose of this document is to specify the recommended method for measuring alphaemissivity in materials utilized in the manufacturing of semiconductors. The method specificallyapplies to gas proportional instruments and designates recommended instrument settings. Inaddition, the method discusses operation of ionization counters. The document also recommendsmethods for determining sample size and for evaluating instrument background accurately.Treatment of data is also outlined, including identification and elimination of systematic errors.The calculation of results and detection limits is detailed with examples in the annexes. Astandard format for reporting results is specified.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD100B.01

JEDEC JESD100B.01

TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROCOMPUTERS, MICROPROCESSORS, AND MEMORY INTEGRATED CI..

$46.00 $91.00

JEDEC JESD 22-B108A

JEDEC JESD 22-B108A

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES..

$27.00 $53.00

JEDEC JEP145

JEDEC JEP145

GUIDELINE FOR ASSESSING THE CURRENT-CARRYING CAPABILITY OF THE LEADS IN A POWER PACKAGE SYSTEM..

$27.00 $53.00

JEDEC JEP104C.01

JEDEC JEP104C.01

REFERENCE GUIDE TO LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES..

$58.00 $116.00