• JEDEC JESD234

JEDEC JESD234

  • Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
  • standard by JEDEC Solid State Technology Association, 10/01/2013
  • Category: JEDEC

$78.00 $39.00

This test standard defines the requirements and procedures for 40 to 500 MeV proton irradiation of electronic devices for Single Event Effects (SEE), and reporting the results. Protons are capable of causing SEE by both direct and indirect ionization, however, in this energy range, indirect ionization will be the dominant cause of SEE [1-3]. Indirect ionization is produced from secondary particles of proton/material nuclear reactions, where the material is Si or any other element present in the semiconductor. Direct proton ionization is thought to be a minor source of SEE, at these energies. This energy range is also selected to coincide with the commonly used proton facilities, and result in the fewest energy dependent issues during test.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JEP133C

JEDEC JEP133C

GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID ..

$39.00 $78.00

JEDEC JESD 209-2B

JEDEC JESD 209-2B

LOW POWER DOUBLE DATA RATE 2 (LPDDR2)..

$124.00 $247.00

JEDEC JESD 209B

JEDEC JESD 209B

LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD..

$58.00 $116.00

JEDEC JESD 35-A

JEDEC JESD 35-A

PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS..

$44.00 $87.00