• JEDEC JESD340 (R2009)

JEDEC JESD340 (R2009)

  • STANDARD FOR THE MEASUREMENT OF CRE
  • standard by JEDEC Solid State Technology Association, 11/01/1967
  • Category: JEDEC

$54.00 $27.00

This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD8C.01

JEDEC JESD8C.01

INTERFACE STANDARD FOR NOMINAL 3.0 V/3.3 V SUPPLY DIGITAL INTEGRATED CIRCUITS..

$28.00 $56.00

JEDEC JESD 8-11A.01

JEDEC JESD 8-11A.01

ADDENDUM No. 11A.01 to JESD8 - 1.5 V +/- 0.1 V (NORMAL RANGE) AND 0.9 - 1.6 V (WIDE RANGE) POWER SUP..

$27.00 $53.00

JEDEC JESD22-B102E

JEDEC JESD22-B102E

SOLDERABILITY..

$34.00 $67.00

JEDEC JESD89-1A

JEDEC JESD89-1A

TEST METHOD FOR REAL-TIME SOFT ERROR RATE..

$28.00 $56.00