• JEDEC JESD38

JEDEC JESD38

  • STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
  • standard by JEDEC Solid State Technology Association, 12/01/1995
  • Category: JEDEC

$54.00 $27.00

This standard is to promote unification of content and format of semiconductor device failure-analysis reports so that reports from diverse laboratories may be easily read, compared, and understood by customers. Additional objectives are to ensure that reports can be easily ready by users, satisfactorily reproduced on copying machines, adequately transmitted by telefax, and conveniently stored in standard filing cabinets.
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JEDEC JEP123

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GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERS..

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JEDEC JESD52

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STANDARD FOR DESCRIPTION OF LOW VOLTAGE TTL-COMPATIBLE CMOS LOGIC DEVICES..

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JEDEC JESD51

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METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)..

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