• JEDEC JESD38

JEDEC JESD38

  • STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
  • standard by JEDEC Solid State Technology Association, 12/01/1995
  • Category: JEDEC

$54.00 $27.00

This standard is to promote unification of content and format of semiconductor device failure-analysis reports so that reports from diverse laboratories may be easily read, compared, and understood by customers. Additional objectives are to ensure that reports can be easily ready by users, satisfactorily reproduced on copying machines, adequately transmitted by telefax, and conveniently stored in standard filing cabinets.
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JEDEC JESD 22-A110C

JEDEC JESD 22-A110C

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)..

$27.00 $54.00

JEDEC JESD22-A104D

JEDEC JESD22-A104D

TEMPERATURE CYCLING..

$30.00 $59.00

JEDEC JESD 22-A117B

JEDEC JESD 22-A117B

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST..

$31.00 $62.00

JEDEC JESD 209A-1

JEDEC JESD 209A-1

Addendum No. 1 to JESD209A - LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM, 1.2 V I/O..

$27.00 $53.00