• JEDEC JESD38

JEDEC JESD38

  • STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
  • standard by JEDEC Solid State Technology Association, 12/01/1995
  • Category: JEDEC

$54.00 $27.00

This standard is to promote unification of content and format of semiconductor device failure-analysis reports so that reports from diverse laboratories may be easily read, compared, and understood by customers. Additional objectives are to ensure that reports can be easily ready by users, satisfactorily reproduced on copying machines, adequately transmitted by telefax, and conveniently stored in standard filing cabinets.
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JEDEC JESD22-A100-A

JEDEC JESD22-A100-A

Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity..

$80.00 $160.00

JEDEC JEP115 (R1999)

JEDEC JEP115 (R1999)

POWER MOSFET ELECTRICAL DOSE RATE TEST METHOD..

$27.00 $53.00

JEDEC JESD 24-1 (R2002)

JEDEC JESD 24-1 (R2002)

ADDENDUM No. 1 to JESD24 - METHOD FOR MEASUREMENT OF POWER DEVICE TURN-OFF SWITCHING LOSS..

$27.00 $53.00

JEDEC JESD 24-5 (R2002)

JEDEC JESD 24-5 (R2002)

ADDENDUM No. 5 to JESD24 - SINGLE PULSE UNCLAMPED INDUCTIVE SWITCHING (UIS) AVALANCHE TEST METHOD..

$24.00 $48.00