• JEDEC JESD47H

JEDEC JESD47H

  • STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
  • standard by JEDEC Solid State Technology Association, 02/01/2011
  • Category: JEDEC

$67.00 $34.00

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
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JEDEC JESD251-1

JEDEC JESD251-1

Addendum No. 1 to JESD251, Optional x4 Quad I/O With Data Strobe..

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JEDEC JESD252

JEDEC JESD252

SERIAL FLASH RESET SIGNALING PROTOCOL..

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JEDEC JESD22-B119

JEDEC JESD22-B119

MECHANICAL COMPRESSIVE STATIC STRESS TEST METHODS..

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JEDEC JESD216D

JEDEC JESD216D

Seriel Flash Discoverable Parameters (SFDP)..

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