• JEDEC JESD47I

JEDEC JESD47I

  • STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
  • standard by JEDEC Solid State Technology Association, 04/01/2011
  • Category: JEDEC

$72.00 $36.00

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
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