• JEDEC JESD47J.01

JEDEC JESD47J.01

  • STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
  • standard by JEDEC Solid State Technology Association, 09/01/2017
  • Category: JEDEC

$74.00 $37.00

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
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