• JEDEC JESD47J

JEDEC JESD47J

  • STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
  • standard by JEDEC Solid State Technology Association, 08/01/2017
  • Category: JEDEC

$74.00 $37.00

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD82-7A

JEDEC JESD82-7A

DEFINITION OF THE SSTU32864 1.8-V CONFIGURABLE REGISTERED BUFFER FOR DDR2 RDIMM APPLICATIONS..

$30.00 $59.00

JEDEC JESD22-A119 (R2009)

JEDEC JESD22-A119 (R2009)

LOW TEMPERATURE STORAGE LIFE..

$26.00 $51.00

JEDEC JESD22-B104C (R2009)

JEDEC JESD22-B104C (R2009)

MECHANICAL SHOCK..

$27.00 $53.00

JEDEC JESD 22-B110A (R2009)

JEDEC JESD 22-B110A (R2009)

SUBASSEMBLY MECHANICAL SHOCK..

$28.00 $56.00