• JEDEC JESD531 (R2002)

JEDEC JESD531 (R2002)

  • THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD)
  • standard by JEDEC Solid State Technology Association, 07/01/1986
  • Category: JEDEC

$59.00 $30.00

This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that existed earlier for both signal and regulator diode applications in testing for thermal resistance. Previously published as ID-13. ANSI/EIA-531-1986 (July) expired June 1996. Became JESD531 after reaffirmation April 2002.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD 209B

JEDEC JESD 209B

LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD..

$58.00 $116.00

JEDEC JESD 35-A

JEDEC JESD 35-A

PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS..

$44.00 $87.00

JEDEC JESD84-A441

JEDEC JESD84-A441

EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write,..

$124.00 $247.00

JEDEC JESD213

JEDEC JESD213

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ..

$27.00 $53.00