JEDEC JESD89-2A
- TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE
- standard by JEDEC Solid State Technology Association, 10/01/2007
- Category: JEDEC
$60.00
$30.00
This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alpha source.
PDF
All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.
Multi-User Access
After purchasing, you have the ability to assign each license to a specific user.
Printable
At any time, you are permitted to make printed copies for your and your members' reference use.