• JEDEC JESD94B

JEDEC JESD94B

  • APPLICATION SPECIFIC QUALIFICATION USING KNOWLEDGE BASED TEST METHODOLOGY
  • standard by JEDEC Solid State Technology Association, 10/01/2015
  • Category: JEDEC

$80.00 $40.00

The method described in this document applies to all application specific reliability testing for solid state components with known failure mechanisms where the test duration and conditions vary based on application variables. This document does not cover reliability tests that are characterization based or essentially go / no-go type tests, for example, ESD, latch-up, or electrical over stress. Also, it does not attempt to cover every failure mechanism or test environment, but does provide a methodology that can be extended to other failure mechanisms and test environments.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD8-7A

JEDEC JESD8-7A

ADDENDUM No. 7 to JESD8 - 1.8 V + -0.15 V (NORMAL RANGE), AND 1.2 V - 1.95 V (WIDE RANGE) POWER SUPP..

$27.00 $54.00

JEDEC JESD22-B117A

JEDEC JESD22-B117A

SOLDER BALL SHEAR..

$28.00 $56.00

JEDEC JESD 46C

JEDEC JESD 46C

CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERS..

$27.00 $53.00

JEDEC JEP121A

JEDEC JEP121A

REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION..

$38.00 $76.00