• JIS Z 2351:2011

JIS Z 2351:2011

  • Method for evaluating electronic characteristics of ultrasonic test instruments (Foreign Standard)
  • standard by Japanese Industrial Standard / Japanese Standards As
  • Category: JIS

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JIS R 1632:2010

JIS R 1632:2010

Test methods for static bending fatigue of fine ceramics (Foreign Standard)..

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JIS X 6319-4:2010

JIS X 6319-4:2010

Specification of implementation for integrated circuit(s) cards -- Part 4: High speed proximity card..

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JIS E 2501-2:2010

JIS E 2501-2:2010

Railway applications -- Fixed installations -- DC switchgear -- Part 2: DC circuit-breakers (Foreign..

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JIS C 8105-2-2:2003/AMENDMENT 1:2010

JIS C 8105-2-2:2003/AMENDMENT 1:2010

Luminaires -- Part 2: Particular requirements for safety -- Section 2: Recessed luminaires (Amendmen..

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