• SAE J1752/3_201709

SAE J1752/3_201709

  • Measurement of Radiated Emissions from Integrated Circuits¿¿¿TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), W
  • standard by SAE International, 09/22/2017
  • Category: SAE

$81.00 $41.00

SAE J1752/3_201709 defines a method for measuring the electromagnetic radiation from an integrated circuit(IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port(referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in thecell as in the conventional usage but becomes a part of the cell wall.
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SAE AS3233A

SAE AS3233A

BOLT, TEE HEAD - CHAMFERED, PD SHANK, NICKEL ALLOY, 165 KSI MIN UTS .2500-28 UNJF-3A..

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SAE AS3234A

SAE AS3234A

BOLT, TEE HEAD - CHAMFERED, PD SHANK NICKEL ALLOY (UNS N07001), 165 KSI MIN UTS .3125-24 UNJF-3A..

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SAE AS3235C

SAE AS3235C

BOLT, TEE HEAD ¿¿¿ CHAMFERED, PD SHANK NICKEL ALLOY (UNS N07001),165 KSI MIN UTS .3750-24 UNJF-3A..

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SAE AS5008A

SAE AS5008A

FITTING, UNION, EXTERNAL SWAGE, HYDRAULIC..

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