• SAE J2052_201607

SAE J2052_201607

  • Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)
  • standard by SAE International, 07/12/2016
  • Category: SAE

$81.00 $41.00

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
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